Ronchi interferometry for characterization of hard x- ray nanofocusing optics

نویسندگان

  • U. Vogt
  • F. Uhlén
  • D. Nilsson
  • J. Rahomäki
  • F. Seiboth
  • C. G. Schroer
چکیده

Hard x-ray nanobeams have become an important tool in modern synchrotron radiation research with applications in many different fields like biology, chemistry, physics and material science. These nanobeams are usually created by focusing undulator radiation with highly specialized nanofocusing optics like reflective Kirkpatrick-Beaz mirror systems, diffractive zone plates or refractive compound lenses to focal spot sizes below 100 nm in diameter. The optics should in the best case not introduce any aberrations into the wavefield to ensure diffraction-limited focusing performance, and therefore the characterization of the hard x-ray nanobeam behind the focusing optic has become an important issue. The aim of the experiment was to introduce a classical scheme for this task, the so-called Ronchi test.

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تاریخ انتشار 2014