Ronchi interferometry for characterization of hard x- ray nanofocusing optics
نویسندگان
چکیده
Hard x-ray nanobeams have become an important tool in modern synchrotron radiation research with applications in many different fields like biology, chemistry, physics and material science. These nanobeams are usually created by focusing undulator radiation with highly specialized nanofocusing optics like reflective Kirkpatrick-Beaz mirror systems, diffractive zone plates or refractive compound lenses to focal spot sizes below 100 nm in diameter. The optics should in the best case not introduce any aberrations into the wavefield to ensure diffraction-limited focusing performance, and therefore the characterization of the hard x-ray nanobeam behind the focusing optic has become an important issue. The aim of the experiment was to introduce a classical scheme for this task, the so-called Ronchi test.
منابع مشابه
Ronchi test for characterization of nanofocusing optics at a hard x-ray free-electron laser.
We demonstrate the use of the classical Ronchi test to characterize aberrations in focusing optics at a hard x-ray free-electron laser. A grating is placed close to the focus and the interference between the different orders after the grating is observed in the far field. Any aberrations in the beam or the optics will distort the interference fringes. The method is simple to implement and can p...
متن کاملPtychographic characterization of the wavefield in the focus of reflective hard X-ray optics.
A technique for quantitatively characterizing the complex-valued focal wavefield of arbitrary optics is described and applied to reconstructing the coherent focused beam produced by a reflective/diffractive hard X-ray mirror. This phase-retrieval method, based on ptychography, represents an important advance in X-ray optics characterization because the information obtained and potential resolut...
متن کاملTwo dimensional hard x-ray nanofocusing with crossed multilayer Laue lenses.
Hard x-ray microscopy with nanometer resolution will open frontiers in the study of materials and devices, environmental sciences, and life sciences by utilizing the unique characterization capabilities of x-rays. Here we report two-dimensional nanofocusing by multilayer Laue lenses (MLLs), a type of diffractive optics that is in principle capable of focusing x-rays to 1 nm. We demonstrate focu...
متن کاملReconstruction of an astigmatic hard X-ray beam and alignment of K-B mirrors from ptychographic coherent diffraction data.
We have used coherent X-ray diffraction experiments to characterize both the 1-D and 2-D foci produced by nanofocusing Kirkpatrick-Baez (K-B) mirrors, and we find agreement. Algorithms related to ptychography were used to obtain a 3-D reconstruction of a focused hard X-ray beam waist, using data measured when the mirrors were not optimally aligned. Considerable astigmatism was evident in the re...
متن کاملHard X-ray nanofocusing at low-emittance synchrotron radiation sources
X-ray scanning microscopy relies on intensive nanobeams generated by imaging a highly brilliant synchrotron radiation source onto the sample with a nanofocusing X-ray optic. Here, using a Gaussian model for the central cone of an undulator source, the nanobeam generated by refractive X-ray lenses is modeled in terms of size, flux and coherence. The beam properties are expressed in terms of the ...
متن کامل